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componentes Descripción

Fabricante

CXA3276Q

8-bit 160MSPS Flash A/D Converter

Sony Semiconductor 

CXA3276Q

Electrical Characteristics Measurement Circuit

Current Consumption Measurement Circuit

5V

5V

A Icc

A IEE

Sampling Delay Measurement Circuit

Aperture Jitter Measurement Circuit

100MHz

OSC1

φ: Variable

Amp

4V

VRT

AVCC

DVCC1

DVCC2

DGND3

fr

VIN

8

Logic

CXA3276Q

Analiyzer

CLK

1.95V

VIN

CLK/E

5MHz PECL

OSC2

1024

samples

2V

VRB

DGND2

DGND1

AGND

DVEE3

100MHz

ECL

Buffer

Integral Linearity Error Measurement Circuit

Differential Linearity Error Measurement Circuit

+V

S2

S1: ON when A < B

S1 S2: ON when A > B

Aperture Jitter Measurement Method

VIN

CLK

VRT

VRM2

VRB

VIN

DVM

8

CXA3276Q

–V

A<B A>B

Comparator

A8 B8 8

to to

A1 B1

A0 B0

“0”

“1”

Controller

Buffer

000 ··· 00

to

111 ··· 10

Error Rate Measurement Circuit

∆υ

129

∆t

128

σ (LSB)

VIN

127

126

125

CLK

Sampling timing fluctuation

(= aperture jitter)

Where σ (LSB) is the deviation of the output codes when

the largest slew rate point is sampled at the clock which

has exactly the same frequency as the analog input

signal, the aperture jitter Taj is:

Taj = σ/

∆υ

∆t

= σ/ ( 256

2

× 2πf )

Signal

VIN

Source

Fc

N

– 1kHz

2Vp-p Sin Wave

CXA3276Q

8

Latch

CLK

CLK

A

Comparator

B

A>B

+

Latch

Pulse

Counter

Signal

Source

Fc

16LSB

1/N

– 11 –

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