SMDB05V Ver la hoja de datos (PDF) - SEOUL SEMICONDUCTOR
Número de pieza
componentes Descripción
Fabricante
SMDB05V Datasheet PDF : 19 Pages
| |||
A P CP CW M_4828539:W P _0000001W P _0000001
5. Reliability Test
* TEST ITEMS AND RESULTS
Item
Reference
Test Condition
Life Test
-
High Temperature
Life Test
Low Temperature
Life Test
High Humidity
Heat Life Test
High Temperature
Storage
Low Temperature
Storage
Temperature Cycle
-
-
JEITA ED-4701
100 102
JEITA ED-4701
200 201
JEITA ED-4701
200 202
JEITA ED-4701
100 105
Ta = 25℃, IF = 20mA
Ta = 85℃, IF = 5mA
Ta = -30℃, IF = 20mA
Ta = 60℃, RH = 90%, IF = 20mA
Ta = 100℃
Ta = -40℃
-40℃ ~ 25℃ ~ 100℃ ~ 25℃
(30min) (5min) (30min) (5min)
Duration
/ Cycle
1,000
Hours
1,000
Hours
1,000
Hours
500
Hours
1,000
Hours
1,000
Hours
100 cycle
Number of
Damage
0/20
0/20
0/20
0/20
0/20
0/20
0/50
* Criteria for Judging the Damage
Item
Symbol
Condition
Forward Voltage
VF
Luminous Intensity
IV
Note : *1 I.V. : Initial Value
*2 U.S.L : Upper Standard Level
IF =20mA
IF =20mA
[9 /19]
Criteria for Judgement
MIN
MAX
-
I.V. *1 × 1.2
I.V. × 0.7
-
Rev. 00
October, 2012
www.acrich.com
Document No. : QP-7-07-18 (Rev.00) 공통_을
Share Link: 