ATF-38143 Ver la hoja de datos (PDF) - Avago Technologies
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ATF-38143 Datasheet PDF : 12 Pages
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ATF-38143 Electrical Specifications TA = 25°C, RF parameters measured in a test circuit for a typical device
Symbol
Parameters and Test Conditions
Units Min. Typ.[2]
Idss [1]
VP [1]
Id
gm[1]
IGDO
Igss
NF
Ga
OIP3
IIP3
P1dB
Saturated Drain Current VDS = 1.5 V, VGS = 0 V
Pinchoff Voltage
VDS = 1.5 V, IDS = 10% of Idss
Quiescent Bias Current VGS = -0.54 V, VDS = 2 V
Transconductance
VDS = 1.5 V, gm = Idss /VP
Gate to Drain Leakage Current
VGD = -5 V
Gate Leakage Current
VGD = VGS = -4 V
f = 2 GHz
Noise Figure
f = 900 MHz
Associated Gain[3]
f = 2 GHz
f = 900 MHz
Output 3rd Order
Intercept Point[3]
Input 3rd Order
Intercept Point[3]
1 dB Compressed
Compressed Power[3]
f = 2 GHz
f = 900 MHz
f = 2 GHz
f = 900 MHz
f = 2 GHz
f = 900 MHz
VDS = 2 V, IDS = 5 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 20 mA
VDS = 2 V, IDS = 5 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 20 mA
VDS = 2 V, IDS = 5 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 20 mA
VDS = 2 V, IDS = 5 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 20 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 10 mA
VDS = 2 V, IDS = 10 mA
mA 90 118
V -0.65 -0.5
mA — 10
mmho 180 230
μA
μA — 30
dB
0.6
0.4
0.3
dB
0.6
0.4
0.3
dB
15.3
15 16.0
17.0
dB
17.0
19.0
20.5
dBm 18.5 22.0
dBm
22.0
dBm
6.0
dBm
3.0
dBm
12.0
dBm
12.0
Notes:
1. Guaranteed at wafer probe level.
2. Typical value determined from a sample size of 450 parts from 6 wafers.
3. Measurements obtained using production test board described in Figure 5.
Max.
145
-0.35
—
—
500
300
0.85
18
Input
50 Ohm
Transmission Line
(0.5 dB loss)
Input
Matching Circuit
Γmag = 0.380
Γang = 58.2°
(0.46 dB loss)
DUT
Output
Matching Circuit
Γmag = 0.336
Γang = 34.5°
(0.46 dB loss)
50 Ohm
Transmission Line
(0.5 dB loss)
Output
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Associated Gain, P1dB, and OIP3 measurements. This circuit represents a trade-
off between an optimal noise match and a realizable match based on production test board requirements. Circuit losses have been de-embedded from
actual measurements.
3
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