ATF-38143 Ver la hoja de datos (PDF) - Avago Technologies
Número de pieza
componentes Descripción
Fabricante
ATF-38143 Datasheet PDF : 12 Pages
| |||
ATF-38143 Absolute Maximum Ratings[1]
Symbol
VDS
VGS
VGD
IDS
Pdiss
Pin max
TCH
TSTG
jc
Parameter
Drain - Source Voltage[2]
Gate - Source Voltage
Gate Drain Voltage
Drain Current
Total Power Dissipation[2]
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance[3]
Units
V
V
V
mA
mW
dBm
°C
°C
°C/W
Absolute
Maximum
4.5
-4
-4
Idss
580
17
160
-65 to 160
165
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Source lead temperature is 25°C. Derate
6 mW/°C for TL > 64°C.
3. Thermal resistance measured using 150°C
Liquid Crystal Measurement method.
Product Consistency Distribution Charts
250
+0.6 V
200
150
0V
100
50
–0.6 V
0
0
1
2
3
4
5
VDS (V)
Figure 1. Typical I-V Curves. (VGS=-0.2V per step)
180
150
120
-3 Std
+3 Std
90
Cpk = 4.08938
Stdev = 0.03 dB
6 Wafers
Sample Size = 450
60
30
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
NF (dB)
Figure 3. NF @ 2 GHz, 2 V, 10 mA.
LSL=0, Nominal=0.44, USL=0.85
300
250
200
-3 Std
150
+3 Std
Cpk = 1.59062
Stdev = 0.73 dBm
6 Wafers
Sample Size = 450
100
50
0
18
20
22
24
26
OIP3 (dB)
Figure 2. OIP3 @ 2 GHz, 2 V, 10 mA.
LSL=18.5, Nominal=21.99, USL=26.0
160
120
-3 Std +3 Std
80
Cpk = 2.58097
Stdev = 0.14 dB
6 Wafers
Sample Size = 450
40
0
15 15.5
16 16.5 17 17.5 18
GAIN (dB)
Figure 4. Gain @ 2 GHz, 2 V, 10 mA.
LSL=15.0, Nominal=16.06, USL= 18.0
Note:
Distribution data sample size is 450 samples taken from 6 different
wafers. Future wafers allocated to this product may have nominal values
anywhere within the upper and lower spec limits. Measurements made
on production test board. This circuit represents a trade-off between
an optimal noise match and a realizeable match based on production
test requirements. Circuit losses have been de-embedded from actual
measurements.
2
Share Link: 