NXP Semiconductors
PESD5V0U5BF; PESD5V0U5BV
Ultra low capacitance bidirectional fivefold ESD protection arrays
ESD TESTER
RZ
CZ
IEC 61000-4-2 network
CZ = 150 pF; RZ = 330 Ω
450 Ω
RG 223/U
50 Ω coax
DUT
(DEVICE
UNDER
TEST)
10×
ATTENUATOR
4 GHz DIGITAL
OSCILLOSCOPE
50 Ω
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 10 V/div
horizontal scale = 100 ns/div
GND
GND
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
GND
vertical scale = 10 A/div
horizontal scale = 15 ns/div
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
GND
unclamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network)
Fig 4. ESD clamping test setup and waveforms
vertical scale = 10 V/div
horizontal scale = 100 ns/div
clamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network) pin 1 to 2
006aab037
PESD5V0U5BF_PESD5V0U5BV_1
Product data sheet
Rev. 01 — 15 August 2008
© NXP B.V. 2008. All rights reserved.
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