HCPL-257K-100 Ver la hoja de datos (PDF) - HP => Agilent Technologies

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HCPL-257K-100

Hermetically Sealed, Transistor Output Optocouplers for Analog and Digital Applications

HP => Agilent Technologies 

Typical Characteristics, TA = 25°C, VCC = 5 V

Parameter

Symbol Typ. Units

Input Capacitance

Input Diode Temperature

Coefficient

Resistance (Input-Output)

Capacitance (Input-Output)

Transistor DC Current Gain

Small Signal Current

Transfer Ratio

Common Mode Transient

Immunity at Logic High

Level Output

CIN

∆VF

∆TA

RI-O

CI-O

hFE

∆IO

∆IF

|CMH|

60

-1.5

1012

1.0

250

21

1000

pF

mV/°C

Ω

pF

-

%

V/µs

Common Mode Transient

Immunity at Logic Low

|CML| -1000 V/µs

Level Output

Bandwidth

BW

9

MHz

Test Conditions

VF = 0 V, f = 1 MHz

IF = 20 mA

VI-O 500 V

f = 1 MHz

VO = 5 V, IO = 3 mA

VCC = 5 V, VO = 2 V

IF = 0 mA, RL = 8.2 kΩ,

VO (min) = 2.0 V

VCM = 10 VP-P

IF = 16 mA, RL = 8.2 kΩ,

VO (max) = 0.8 V

VCM = 10 VP-P

Fig. Note

1

1

3

1, 11

1

7

1

10 1, 7

10 1, 7

8

8

Multi-Channel Product Only

Input-Input Insulation

Leakage Current

II-I

1

pA Relative Humidity = 45%

5, 9

VI-I = 500 V, t = 5 s

Resistance (Input-Input)

RI-I

1012

Ω

VI-I = 500 V

5

Capacitance (Input-Input)

CI-I

0.8

pF f = 1 MHz

5

Notes:

1. Each channel of a multi-channel device.

2. Current Transfer Ratio is defined as the ratio of output collector current, IO, to the forward LED input current, IF, times 100%.

CTR is known to degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system

on time. Refer to Application Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25%

guardband for CTR degradation.

3. All devices are considered two-terminal devices; measured between all input leads or terminals shorted together and all output

leads or terminals shorted together.

4. The 4N55, 4N55/883B, HCPL-6530 and HCPL-6531 dual channel parts function as two independent single channel units. Use the

single channel parameter limits. IF = 0 mA for channel under test and IF = 20 mA for other channels.

5. Measured between adjacent input pairs shorted together for each multichannel device.

6. tPHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading

edge of the output pulse. The tPLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the

1.5 V point on the trailing edge of the output pulse.

7. CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state

(VO < 0.8 V). CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the

logic high state (VO > 2.0 V).

8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the

typical bandwidth is 2 MHz.

9. This is a momentary withstand test, not an operating condition.

10. Higher CTR minimums are available to support special applications.

11. Measured between each input pair shorted together and all output connections for that channel shorted together.

12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and

-55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).

13. Not required for 4N55, 4N55/883B and 5962-8767901 types.

14. Required for 4N55, 4N55/883B and 5962-8767901 types only.

1-566

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