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SGA-8343X

Reliability Qualification Report

Stanford Microdevices 

SGA-8343X Reliability Qualification Report

VIIII. Electrostatic Discharge Classification

Sirenza Microdevices classifies Human Body Model (HBM) electrostatic discharge (ESD)

according to the JESD22-A114 convention. All pin pair combinations were tested. Each

pin pair is stressed at one static voltage level using 1 positive and 1 negative pulse

polarity to determine the weakest pin pair combination. The weakest pin pair is tested

with 3 devices below and above the failure voltage to classify the part. The Pass/Fail

status of a part is determined by the manufacturing test specification. The ESD class

quoted indicates that the device passed exposure to a certain voltage, but does not pass

the next higher level. The following table indicates the JESD ESD sensitivity

classification levels. The results of the testing indicate that SGA-8343X’s HBM ESD

rating is Class 1B.

Class

0

1A

1B

1C

2

Passes

0V

250 V

500 V

1000 V

2000 V

Fails

<250 V

500 V

1000 V

2000 V

4000 V

X. Operational Life Test Results

The results for SGA-8343X High Temperature Operating Life Test are as follows:

HTOL Completion

Test

Date

Duration

Junction

Temperature

Quantity

Device Hours

Mar-04

1000

150°C

80

80,000

hours

Table 1: Summary of High Temperature Operational Life Test Cumulative Device Hours

XI. Qualification Test Results for SGA-8343X

Initial Qualification Date – March, 2004

Group A0

Test Conditions

Number of

Devices Under

Test

Moisture preconditioning and three reflow cycles

Temperature = 270°C Peak, Slope < 6°C/second

145

Test

JESD22-

Results

Standard

A113(C)

PASS

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