SGA-8343X Ver la hoja de datos (PDF) - Stanford Microdevices
Número de pieza
componentes Descripción
Fabricante
SGA-8343X Datasheet PDF : 9 Pages
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SGA-8343X Reliability Qualification Report
Group J
Test Conditions
Tin Whiskering Biased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
Number of
Devices Under
Test
Group K
Test Conditions
15
Test
SMDI Internal
Results PASS
Standard
Tin Whiskering Unbiased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
Number of
15
Devices Under
Test
Test
Standard
SMDI Internal
Results PASS
(1)
1 device removed for improper assembly. See CAR number 350; Reference FA04032.
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