MX28F1000P Ver la hoja de datos (PDF) - Macronix International

Número de pieza

componentes Descripción

Fabricante

MX28F1000P

1M-BIT [128K x 8] CMOS FLASH MEMORY

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE

UNDER

TEST

CL

6.2K ohm

MX28F1000P

1.8K ohm

+5V

DIODES = IN3064

OR EQUIVALENT

CL = 100 pF including jig capacitance(35pF for 70 ns parts)

SWITCHING TEST WAVEFORMS

2.4 V

0.45 V

2.0V

INPUT

0.8V

TEST POINTS

2.0V

0.8V

OUTPUT

AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".

Input pulse rise and fall times are <20ns.

P/N: PM0340

REV. 1.6, JAN. 19, 1999

15

Share Link: