FOD8012 Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Fabricante
FOD8012 Datasheet PDF : 12 Pages
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Test Circuits
0.1µF
1
VOA
2
CL
3
VDD1
4
8
7
0.1µF
VOB
6
5
VDD2
0V~3.3V
Input
tPLH
VIN
tPHL
3.3V
50%
Output
90%
VOUT 10%
tR
VOH
50%
VOL
tF
Figure 11. Test Circuit for Propogation Delay Time and Rise Time, Fall Time
0.1µF
1
VOA
2
CL
8
7
0.1µF
A
B
VDD2
VDD1
3
6
4
5
–+
Vcm
Pulse Gen
GND
VCM
VOH
Switching Pos. (A), VIN = 3.3V
0.8 x VDD
CMH
VOL
0.8V
Switching Pos. (B), VIN = 0V
CML
Figure 12. Test Circuit for Instantaneous Common Mode Rejection Voltage
©2010 Fairchild Semiconductor Corporation
FOD8012 Rev. 1.0.5
8
www.fairchildsemi.com
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