BR34E02FVT-3 Ver la hoja de datos (PDF) - ROHM Semiconductor
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BR34E02FVT-3 Datasheet PDF : 20 Pages
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BR34E02FVT-3,BR34E02NUX-3
Technical Note
●Memory cell characteristics(Ta=25℃, VCC=1.7～5.5V)
Parameter
Limits
Min.
Typ.
Write / Erase Cycle *1
1,000,000
－
Data Retention
*1
40
－
*1:Not 100% TESTED
Max.
－
－
Unit
Cycles
Years
●Electrical characteristics - DC(Unless otherwise specified Ta=-40～+85℃, VCC=1.7～5.5V)
Parameter
Symbol
Limits
Unit
Min. Typ. Max.
Test Condition
"H" Input Voltage
VIH 0.7 VCC - Vcc+1.0 V
"L" Input Voltage
VIL
-0.3
- 0.3 VCC V
"L" Output Voltage 1
VOL1
-
-
0.4
V IOL=2.1mA, 2.5V≦VCC≦5.5V(SDA)
"L" Output Voltage 2
VOL2
-
-
0.2
V IOL=0.7mA, 1.7V≦VCC＜2.5V(SDA)
Input Leakage Current 1
ILI1
-1
-
1
µA VIN=0V～VCC(A0,A1,A2,SCL)
Input Leakage Current 2
ILI2
-1
-
15
µA VIN=0V～VCC(WP)
Input Leakage Current 3
ILI3
-1
-
20
µA VIN=VHV(A0)
Output Leakage Current
Operating Current
Standby Current
A0 HV Voltage
ILO
-1
ICC1
-
ICC2
-
ISB
-
VHV
7
-
1
µA VOUT=0V～VCC
VCC=5.5V,fSCL=400kHz, tWR=5ms
-
2.0
mA
Byte Write
Page Write
Write Protect
VCC =5.5V,fSCL=400kHz
-
0.5
mA
Random Read
Current Read
Sequential Read
-
2.0
µA
VCC =5.5V,SDA,SCL= VCC
A0,A1,A2=GND,WP=GND
-
10
V VHV-Vcc≧4.8V
○Note: This IC is not designed to be radiation-resistant.
●Electrical characteristics - AC(Unless otherwise specified Ta=-40～+85℃, VCC =1.7～5.5V
Parameter
Limits
Symbol
Unit
Min. Typ. Max.
Clock Frequency
fSCL
－
－
400 kHz
Data Clock High Period
tHIGH 0.6
－
－
µs
Data Clock Low Period
tLOW
1.2
－
－
µs
SDA and SCL Rise Time *1
tR
－
－
0.3
µs
SDA and SCL Fall Time *1
tF
－
－
0.3
µs
Start Condition Hold Time
tHD:STA 0.6
－
－
µs
Start Condition Setup Time
tSU:STA 0.6
－
－
µs
Input Data Hold Time
tHD:DAT 0
－
－
ns
Input Data Setup Time
tSU:DAT 100
－
－
ns
Output Data Delay Time
tPD
0.1
－
0.9
µs
Output Data Hold Time
tDH
0.1
－
－
µs
Stop Condition Setup Time
tSU:STO 0.6
－
－
µs
Bus Free Time
tBUF
1.2
－
－
µs
Write Cycle Time
Noise Spike Width
(SDA and SCL)
WP Hold Time
tWR
－
tI
－
tHD:WP 0
－
5
ms
－
0.1
µs
－
－
µs
WP Setup Time
tSU:WP 0.1
－
－
µs
WP High Period
*1:Not 100% TESTED
tHIGH:WP 1.0
－
－
µs
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2/19
2011.11 - Rev.A
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