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VN5010AK-E(2008) Ver la hoja de datos (PDF) - STMicroelectronics

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VN5010AK-E Datasheet PDF : 31 Pages
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Electrical specifications
VN5010AK-E
Table 8. Logic input
Symbol
Parameter
VIL
IIL
VIH
IIH
VI(hyst)
Input low level voltage
Low level input current
Input high level voltage
High level input current
Input hysteresis voltage
VICL Input clamp voltage
VCSDL CS_DIS low level voltage
ICSDL Low level CS_DIS current
VCSDH CS_DIS high level voltage
ICSDH High level CS_DIS current
VCSD(hyst) CS_DIS hysteresis voltage
VCSCL CS_DIS clamp voltage
Test conditions
VIN= 0.9V
VIN= 2.1V
IIN= 1mA
IIN= -1mA
VCSD= 0.9V
VCSD= 2.1V
ICSD= 1mA
ICSD= -1mA
Min. Typ. Max. Unit
0.9 V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
V
0.9 V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
V
Table 9.
Symbol
Protections and diagnostics(1)
Parameter
Test conditions
Min. Typ. Max. Unit
IlimH Short circuit current
VCC= 13V
5V<VCC<36V
46
65
91 A
91 A
IlimL
Short circuit current during
thermal cycling
VCC= 13V;
TR<Tj<TTSD
24
A
TTSD Shutdown temperature
150 175 200 °C
TR Reset temperature
TRS+1 TRS+5
°C
TRS Thermal reset of STATUS
135
°C
THYST Thermal hysteresis (TTSD-TR)
7
°C
VDEMAG Turn-Off output voltage clamp IOUT=2A; VIN=0; L=6mH
VCC
-41
VCC
-46
VCC
-52
V
Output voltage drop
VON limitation
IOUT=0.5A (see Figure 9.);
Tj= -40°C...+150°C
25
mV
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
10/31

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