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FQD30N06(2013) Ver la hoja de datos (PDF) - Fairchild Semiconductor

Número de pieza
componentes Descripción
Fabricante
FQD30N06
(Rev.:2013)
Fairchild
Fairchild Semiconductor Fairchild
FQD30N06 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Same Type
VGS
50KΩ
as DUT
Qg
12V
200nF
300nF
10V
VGS
VDS
Qgs
Qgd
IG = co3nmsAt.
DUT
Charge
Figure 12. Gate Charge Test Circuit & Waveform
V10GVS
VDS
VGS
RG
RL
VDD
DUT
VDS
90%
VGS 10%
td(on)
tr
t on
td(off)
tf
t off
Figure 13. Resistive Switching Test Circuit & Waveforms
VDS
ID
RG
L
EAS
=
--1--
2
L IAS2
BVDSS
--------------------
BVDSS - VDD
BVDSS
IAS
VDD
ID (t)
V1G0GVSS
tp
DUT
VDD
VDS (t)
tp
Time
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
©2001 Fairchild Semiconductor Corporation
5
FQD30N06 Rev. C1
www.fairchildsemi.com

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