GRM219R11E474KA88J Ver la hoja de datos (PDF) - Murata Manufacturing
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GRM219R11E474KA88J Datasheet PDF : 30 Pages
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■ Specifications and Test Methods
No
Item
1 Rated Voltage
Temperature
Compensating Type
Shown in Rated value.
Specification
High Dielectric
Constant Type
2 Appearance
3 Dimension
4 Voltage proof
No defects or abnormalities.
Within the specified dimensions.
No defects or abnormalities.
5 Insulation Resistance(I.R.)
C≦0.047µF:More than 10000MΩ
C＞0.047µF:More than 500Ω·F
C:Nominal Capacitance
6 Capacitance
Shown in Rated value.
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
The rated voltage is defined as the maximum voltage
which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage,
VP-P or VO-P, whichever is larger, should be maintained
within the rated voltage range.
Visual inspection.
Using calipers. (GRM02 size is based on Microscope)
Measurement Point : Between the terminations
Test Voltage
: 300% of the rated voltage
(Temperature compensating type)
250% of the rated voltage
(High dielectric constant type)
Applied Time
: 1s to 5 s
Charge/discharge current : 50mA max.
Measurement Point : Between the terminations
Measurement Voltage : DC Rated Voltage
Charging Time
: 2 min
Charge/discharge current : 50mA max.
Measurement Temperature : Room Temperature
Measurement Temperature : Room Temperature
7 Q or Dissipation Factor (D.F.)
(1)Temperature Compensating Type
30pF and over:Q≧1000
W.V.:100Vdc :0.025max.(C<0.068µF)
30pF and below:Q≧400+20C
:0.05max.(C≧0.068µF)
C:Nominal Capacitance(pF) W.V.:50/35/25Vdc :0.025max.
Capacitance Frequency
Voltage
C≦1000pF 1.0+/-0.1MHz 0.5 to 5.0Vrms
C＞1000pF 1.0+/-0.1kHz 1.0+/-0.2Vrms
W.V.:16/10Vdc :0.035max.
(2)High Dielectric Constant Type
W.V.:6.3/4Vdc :0.05max.(C<3.3µF)
:0.1max. (C≧3.3µF)
Capacitance
C≦10μF
C＞10μF
Frequency
Voltage
1.0+/-0.1kHz 1.0+/-0.2Vrms
120+/-24Hz 0.5+/-0.1Vrms
8 Temperature No bias
Characteristics
of Capacitance
Nominal values of the
temperature coefficient is
shown in Rated value.
But,the Capacitance Change
under 20℃ is shown
in Table A.
Capacitance Drift *
Within +/-0.2% or +/-0.05pF
(Whichever is larger.)
*Not apply to 1X/25V
B1,B3 : Within +/-10%
(-25°C to +85°C)
R1,R7 : Within +/-15%
(-55°C to +125°C)
R6 : Within +/-15%
(-55°C to +85°C)
C7 : Within +/-22%
(-55°C to +125°C)
C8 : Within +/-22%
(-55°C to +105°C)
L8 : Within +/-15%
(-55°C to +125°C)
: Within +15/-40%
(+125°C to +150°C)
50% of
the rated
voltage
-
B1 : Within +10/-30%
R1 : Within +15/-40%
9 Adhesive Strength
of Termination
No removal of the terminations or other defect
should occur.
The capacitance change should be measured after 5 min
at each specified temp. stage.
In case of applying voltage, the capacitance change should be
measured after 1 min with applying voltage in equilibration of
each temp. stage.
Capacitance value as a reference is the value in step 3.
(1)Temperature Compensating Type
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the
step 1,3 and 5 by the cap. value in step 3.
Step
Temperature(C)
1
Reference Temp.+/-2
2
Min. Operating Temp.+/-3
3
Reference Temp.+/-2
4
Max. Operating Temp.+/-3
5
Reference Temp.+/-2
(2)High Dielectric Constant Type
Step
Temperature(C)
1
Reference Temp.+/-2
2
Min.Operating Temp.+/-3
3
Reference Temp.+/-2
4
Max.Operating Temp.+/-3
5
Reference Temp.+/-2
6
Min.Operating Temp.+/-3
7
Reference Temp.+/-2
8
Max.Operating Temp.+/-3
Applying Voltage(VDC)
No bias
50% of
the rated voltage
(For B1,R1)
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
Solder the capacitor on the test substrate shown in Fig.3.
Type
GRM02
GRM03
GRM15/GRM18
GRM21/GRM31/GRM32
Applied Force(N)
1
2
5
10
Holding Time
: 10+/-1s
Applied Direction : In parallel with the test substrate and vertical with
the capacitor side.
JEMCGS-0001U
2
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