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SI4483EDY Ver la hoja de datos (PDF) - Vishay Semiconductors

Número de pieza
componentes Descripción
Fabricante
SI4483EDY
Vishay
Vishay Semiconductors Vishay
SI4483EDY Datasheet PDF : 6 Pages
1 2 3 4 5 6
Si4483EDY
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Static
Gate Threshold Voltage
VGS(th)
VDS = VGS, ID = - 250 µA
Gate-Body Leakage
IGSS
VDS = 0 V, VGS = ± 4.5 V
VDS = 0 V, VGS = ± 25 V
Zero Gate Voltage Drain Current
IDSS
VDS = - 30 V, VGS = 0 V
VDS = - 30 V, VGS = 0 V, TJ = 70 °C
On-State Drain Currenta
ID(on)
VDS = - 5 V, VGS = - 10 V
Drain-Source On-State Resistancea RDS(on)
VGS = - 10 V, ID = - 14 A
VGS = - 4.5 V, ID = - 11 A
Forward Transconductancea
gfs
VDS = - 15 V, ID = - 14 A
Diode Forward Voltagea
VSD
IS = - 2.7 A, VGS = 0 V
Dynamicb
Turn-On Delay Time
td(on)
Rise Time
Turn-Off Delay Time
tr
td(off)
VDD = - 15 V, RL = 15 Ω
ID - 1 A, VGEN = - 10 V, Rg = 6 Ω
Fall Time
tf
Notes:
a. Pulse test; pulse width 300 µs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
Min.
Typ.
Max.
Unit
- 1.0
- 3.0
V
±1
µA
± 10
mA
-1
µA
- 10
- 30
A
0.007 0.0085
Ω
0.0115 0.014
60
S
- 0.74
- 1.1
V
10
15
20
30
µs
42
65
50
80
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
8
100
10
6
1
4
0.1
TJ = 150 °C
TJ = 25 °C
2
0
0
5
10
15
20
25
30
VGS - Gate-to-Source Voltage (V)
Gate-Current vs. Gate-Source Voltage
0.01
0.001
0.0001
0
6
12
18
24
30
VGS - Gate-to-Source Voltage (V)
Gate Current vs. Gate-Source Voltage
www.vishay.com
2
Document Number: 72862
S-83038-Rev. D, 22-Dec-08

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