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IDT70V657S Ver la hoja de datos (PDF) - Unspecified

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IDT70V657S Datasheet PDF : 23 Pages
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IDT70V657S
High-Speed 3.3V 32K x 36 Asynchronous Dual-Port Static RAM
Preliminary
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VDD = 3.3V ± 150mV)
70V657S
Symbol
Parameter
Test Conditions
Min.
Max. Unit
|ILI|
Input Leakage Current(1)
VDDQ = Max., VIN = 0V to VDDQ
___
10
µA
|ILO|
Output Leakage Current
VOL (3.3V) Output Low Voltage(2)
CE0 = VIH or CE1 = VIL, VOUT = 0V to VDDQ
IOL = +4mA, VDDQ = Min.
___
10
µA
___
0.4
V
VOH (3.3V) Output High Voltage(2)
IOH = -4mA, VDDQ = Min.
2.4
___
V
VOL (2.5V) Output Low Voltage(2)
IOL = +2mA, VDDQ = Min.
___
0.4
V
VOH (2.5V) Output High Voltage(2)
IOH = -2mA, VDDQ = Min.
2.0
___
V
NOTE:
1. At VDD < - 2.0V input leakages are undefined.
2. VDDQ is selectable (3.3V/2.5V) via OPT pins. Refer to p.5 for details.
5615 tbl 09
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(3) (VDD = 3.3V ± 150mV)
70V657S10
Com'l Only
70V657S12
Com'l
& Ind
70V657S15
Com'l
& Ind
Symbol
Parameter
Test Condition
Version Typ.(4) Max. Typ.(4) Max. Typ.(4) Max. Unit
IDD Dynamic Operating CEL and CER= VIL,
Current (Both
Outputs Disabled,
Ports Active)
f = fMAX(1)
COM'L S 340 500 315 465 300 440 mA
IND
S
____
____
365 515 350 490
ISB1 Standby Current
(Both Ports - TTL
Level Inputs)
CEL = CER = VIH
f = fMAX(1)
COM'L S 115 165
90
125
75
100 mA
IND
S
____
____
115 150 100 125
ISB2 Standby Current
(One Port - TTL
Level Inputs)
CE"A" = VIL and CE"B" = VIH(5)
Active Port Outputs Disabled,
f=fMAX(1)
COM'L S 225 340 200 325 175 315 mA
IND
S
____
____
225 365 200 350
ISB3 Full Standby Current Both Ports CEL and
COM'L S 3
15
3
15
3
15 mA
(Both Ports - CMOS CER > VDD - 0.2V, VIN > VDD - 0.2V
Level Inputs)
or VIN < 0.2V, f = 0(2)
IND
S
____
____
6
15
6
15
ISB4 Full Standby Current CE"A" < 0.2V and CE"B" > VDD - 0.2V(5) COM'L S 220 335 195 320 170 310 mA
(One Port - CMOS VIN > VDD - 0.2V or VIN < 0.2V, Active
Level Inputs)
Port, Outputs Disable d, f = fMAX(1)
IND
S
____
____
220 360 195 345
NOTES:
5615 tbl 10
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, using "AC TEST CONDITIONS" at input
levels of GND to 3V.
2. f = 0 means no address or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. VDD = 3.3V, TA = 25°C for Typ, and are not production tested. IDD DC(f=0) = 120mA (Typ).
5. CEX = VIL means CE0X = VIL and CE1X = VIH
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VCC - 0.2V
CEX > VCC - 0.2V means CE0X > VCC - 0.2V or CE1X - 0.2V
"X" represents "L" for left port or "R" for right port.
8

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