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IRM-27XX Ver la hoja de datos (PDF) - EVERLIGHT

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IRM-27XX Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
EVERLIGHT ELECTRONICS CO.,LTD.
IRM-27xx SERIES
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level90%
LTPD10%
Test Items
Test Conditions
Temperature cycle
1 cycle -40
+100
(15min)(5min)(15min)
300 cycle test
Temp: +100
High temperature test Vcc:6V
1000hrs
Low temperature
storage
Temp: -40
1000hrs
High temperature
High humidity
Ta: 85,RH:85%
1000hrs
Failure Judgement Samples(n)
Criteria
Defective(c)
n=22,c=0
L0L×0.8
L45L×0.8
n=22,c=0
L: Lower s
pecification limit
n=22,c=0
n=22,c=0
Solder heat
Temp: 260±510sec
4mm From the bottom of the package.
n=22,c=0
Everlight Electronics Co., Ltd.
Device NoSZDMO-027-025
http:\\www.everlight.com
Prepared date5-Apr-2007
Rev 1
Page: 9 of 10
Prepared byHuayan.Peng

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