CY14B108N-ZSP25XCT Ver la hoja de datos (PDF) - Cypress Semiconductor
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CY14B108N-ZSP25XCT Datasheet PDF : 24 Pages
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CY14B108L, CY14B108N
Data Retention and Endurance
DATAR
NVC
Parameter
Description
Data Retention
Nonvolatile STORE Operations
Min
Unit
20
Years
200
K
Capacitance
In the following table, the capacitance parameters are listed.[9]
CIN
COUT
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
Max
Unit
TA = 25°C, f = 1 MHz,
14
pF
VCC = VCC (Typ)
14
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed. [9]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
48-FBGA 44-TSOP II 54-TSOP II
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, in accordance with
EIA/JESD51.
28.82
7.84
31.11
5.56
30.73
6.08
Unit
°C/W
°C/W
Figure 4. AC Test Loads
3.0V
OUTPUT
30 pF
577 Ω
R1
R2
789 Ω
3.0V
OUTPUT
5 pF
577 Ω
R1
for tristate specs
R2
789 Ω
AC Test Conditions
Input Pulse Levels ....................................................0V to 3V
Input Rise and Fall Times (10% - 90%) ........................ <3 ns
Input and Output Timing Reference Levels .................... 1.5V
Note
9. These parameters are guaranteed by design but not tested.
Document #: 001-45523 Rev. *D
Page 9 of 24
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