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STB7NK80Z-1 Ver la hoja de datos (PDF) - STMicroelectronics

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STB7NK80Z-1 Datasheet PDF : 18 Pages
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Electrical characteristics
STP7NK80Z - STP7NK80ZFP - STB7NK80Z - STB7NK80Z-1
Table 6. Source drain diode
Symbol
Parameter
Test conditions
ISD Source-drain current
ISDM(1) Source-drain current (pulsed)
VSD(2) Forward on voltage
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD = 5.2 A, VGS = 0
ISD = 5.2 A, di/dt = 100
A/µs
VDD = 50 V, Tj = 150°C
(see Figure 21)
1. Pulsed: pulse duration=300µs, duty cycle 1.5%
2. Pulse width limited by safe operating area
Min. Typ. Max. Unit
5.2 A
20.8 A
1.6 V
530
ns
3.31
µC
12.5
A
Table 7. Gate-source zener diode
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
BVGSO (1) Gate-source breakdown voltage Igs=± 1mA (Open Drain) 30
V
1. The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
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