CM1231-02SO Ver la hoja de datos (PDF) - ON Semiconductor

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componentes Descripción

Fabricante

CM1231-02SO

2, 4 and 8-Channel Low-Capacitance ESD Protection Array

ON Semiconductor 

CM1231−02SO

IEC 61000−4−2

Test Standards

Single Stage

ESD Device

Voltage

Probe

Device Under

Protection (DUP)

RVARIABLE

Current

Probe

IRESIDUAL

Figure 9. Single Stage ESD Device Test Setup

IEC 61000−4−2

Test Standards

CM1231

Voltage

Probe

Device Under

Protection (DUP)

RVARIABLE

Current

Probe

IRESIDUAL

Figure 10. CM1231−02SO Test Setup

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