SPT7760 Ver la hoja de datos (PDF) - Cadeka Microcircuits LLC.
Número de pieza
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Fabricante
SPT7760 Datasheet PDF : 8 Pages
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ELECTRICAL SPECIFICATIONS
TJ = TC = TA = +25 °C , VEE=–5.2 V, VRB=–2.0 V, VRM=–1.0 V, VRT=0.00 V, ƒCLK=1 GHz, Duty Cycle=50%, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
SPT7760A
SPT7760B
LEVEL MIN TYP MAX MIN TYP MAX UNITS
Dynamic Performance
Spurious Free Dynamic Range
ƒIN = 50 MHz
ƒIN = 250 MHz
Digital Inputs
Input High Voltage
(CLK, CLK)
Input Low Voltage
(CLK, CLK)
Clock Pulse Width High (tPWH)
Clock Pulse Width Low (tPWL)
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
Rise Time
Fall Time
20% to 80%
20% to 80%
I
47
I
39
43
dB
35
dB
I
–1.1 –0.7
–1.1 –0.7
V
I
–1.8 –1.5
–1.8 –1.5 V
I
0.5
0.4
0.5
0.4
ns
I
0.5
0.4
0.5
0.4
ns
I
–1.1 –0.9
–1.1 –0.9
V
I
–1.8 –1.5
–1.8 –1.5 V
V
450
450
ps
V
450
450
ps
Power Supply Requirements
Voltage VEE
Current IEE
Power Dissipation
IV –4.95 –5.2 –5.45 –4.95 –5.2 –5.45 V
I
1.05 1.2
1.05 1.2 A
I
5.5 6.25
5.5 6.25 W
Typical Thermal Impedance: θJC = +4 °C/W.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Unless otherwise noted, all test are pulsed
tests; therefore, TJ = TC = TA.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7760
3
October 2002
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