DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

ICS84330CI Ver la hoja de datos (PDF) - Integrated Device Technology

Número de pieza
componentes Descripción
Fabricante
ICS84330CI
IDT
Integrated Device Technology IDT
ICS84330CI Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ICS84330CI Data Sheet
720MHZ, CRYSTAL-TO-LVPECL FREQUENCY SYNTHESIZER
Table 5. Crystal Characteristics
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Test Conditions
Minimum Typical Maximum
Fundamental
10
25
50
7
Units
MHz
pF
Table 6. Input Frequency Characteristics, VCC = 3V±5%, VEE = 0V, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
XTAL; NOTE 1
10
fIN
Input Frequency S_CLOCK
FREF_EXT; NOTE 2
10
Typical
Maximum
25
50
Units
MHz
MHz
MHz
NOTE 1: For the crystal frequency range, the M value must be set to achieve the minimum or maximum VCO frequency range of 250MHz to
720MHz. Using the minimum input frequency of 10MHz, valid values of M are 200 M 511. Using the maximum input frequency of 25MHz,
valid values of M are 80 M 230.
NOTE 2: Maximum frequency on FREF_EXT is dependent on the internal M counter limitations. See Application Information Section for
recommendations on optimizing the performance using the FREF_EXT input.
AC Electrical Characteristics
Table 7. AC Characteristics, VCC = 3.3V±5%, VEE = 0V, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
fOUT
tjit(per)
Output Frequency
Period Jitter, RMS; NOTE 1. 2
tjit(cc) Cycle-to-Cycle Jitter; NOTE 1, 2
fOUT 43.75MHz
fOUT < 43.75MHz
tR / tF
Output Rise/Fall Time
S_DATA to S_CLOCK
20% to 80%
tS
Setup Time S_CLOCK to S_LOAD
M, N to nP_LOAD
S_DATA to S_CLOCK
tH
Hold Time
M, N to nP_LOAD
tL
PLL Lock Time
odc
Output Duty Cycle
Minimum
200
20
20
20
20
20
45
Typical
Maximum
720
6
40
50
600
10
55
Units
MHz
ps
ps
ps
ps
ns
ns
ns
ns
ns
ms
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
See Parameter Measurement Information section.
NOTE: Characterized using 16MHz XTAL.
NOTE 1: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 2: See Applications section.
ICS84330CVI REVISION A JANUARY 7, 2011
6
©2011 Integrated Device Technology, Inc.

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]