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GP1600FSM12 Ver la hoja de datos (PDF) - Dynex Semiconductor

Número de pieza
componentes Descripción
Fabricante
GP1600FSM12
Dynex
Dynex Semiconductor Dynex
GP1600FSM12 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
GP1600FSM12
ABSOLUTE MAXIMUM RATINGS
Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme
conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety
precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability.
T = 25˚C unless stated otherwise
case
Symbol
Parameter
Test Conditions
Max.
Units
VCES
V
GES
I
C
I
CM
P
max
Visol
Collector-emitter voltage
VGE = 0V
Gate-emitter voltage
-
Collector current
Maximum power dissipation
Isolation voltage
DC, Tcase = 82˚C
1ms, Tcase = 112˚C
Tcase = 25˚C (Transistor)
Commoned terminals to base plate.
AC RMS, 1 min, 50Hz
1200
V
±20
V
1600
A
3200
A
13.9
kW
2500
V
THERMAL AND MECHANICAL RATINGS
Symbol
Parameter
Rth(j-c)
Rth(j-c)
R
th(c-h)
Thermal resistance - transistor
Thermal resistance - diode
Thermal resistance - Case to heatsink
(per module)
Tj
Junction temperature
T
Storage temperature range
stg
-
Screw torque
Conditions
DC junction to case
DC junction to case
Mounting torque 5Nm
(with mounting grease)
Transistor
Diode
-
Mounting - M6
Electrical connections - M4
Electrical connections - M8
Min. Max. Units
-
9 oC/kW
-
-
20 oC/kW
-
8 oC/kW
-
150 oC
-
125 oC
–40 125 oC
-
5 Nm
-
2 Nm
-
10 Nm
2/10
Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures.
www.dynexsemi.com

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