FOD8333 Ver la hoja de datos (PDF) - ON Semiconductor

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FOD8333

Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset

ON Semiconductor 

23. The time from DESAT threshold is exceeded until the FAULT output goes LOW.

24. The length of time the DESAT threshold must be exceeded before VO begins to go LOW and the FAULT output

begins to go LOW.

25. The UVLO turn-on delay, tUVLO ON, is measured from the VUVLO+ threshold level of the rising edge of the output

supply voltage (VDD) to the 5 V level of the rising edge of the VO signal.

26. The UVLO turn-off delay, tUVLO OFF, is measured from the VUVLO– threshold level of the falling edge of the output

supply voltage (VDD) to the 5 V level of the falling edge of the VO signal.

27. The time to good power, tGP, is measured from the VUVLO+ threshold level of the rising edge of the output supply

voltage (VDD) to the 5 V level of the rising edge of the VO signal.

28. Common-mode transient immunity at output HIGH state is the maximum tolerable negative dVCM/ dt on the trailing

edge of the common-mode pulse, VCM, to assure the output remains in HIGH state (i.e., VO > 15 V or VFAULT > 2 V).

29. Common-mode transient immunity at output LOW state is the maximum positive tolerable dVCM / dt on the leading

edge of the common-mode pulse, VCM, to ensure the output remains in LOW state (i.e., VO < 1.0 V or

VFAULT < 0.8 V).

©2014 Fairchild Semiconductor Corporation

FOD8333 Rev. 1.0.3

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