FMBT3906DW1 Ver la hoja de datos (PDF) - Formosa Technology

Número de pieza

componentes Descripción

Fabricante

FMBT3906DW1

Dual PNP Epitaxial Planar Transistor

Formosa Technology 

Dual PNP Epitaxial Planar Transistor

FMBT3906DW1

High reliability test capabilities

Item Test

Conditions

1. Steady State Operating Life

TA=25°C PD=150mW Test Duration:1000hrs

Formosa MS

2. High Temperature Reverse Bias

3. Temperature Cycle

4. Autoclave

Tj= 150℃, V = CE 80% related volage,Test Duration:1000hrs

-55℃( 15min) to 150℃( 15min)Air to Air Transition Time< 20sec Test Cycles:1000cycle

P=2atm Ta=121℃ RH=100% Test Duration:96hrs

5. High Temperature Storage Life

Ta=150℃ Test Duration:1000hrs

6. Solderability

245℃,Test Duration:5sec

7. High Temperature High Humidity Reverse

Bias

Ta= 85℃, 85% RH, V = CE 80% related volage, Test Duration: 1000hrs

8. Resistance to Soldering Heat

260℃,Test Duration:10sec

http://www.formosams.com/

TEL:886-2-22696661

FAX:886-2-22696141

Page 10

Document ID Issued Date

DS-231113

2008/02/10

Revised Date Revision

2010/03/10

B

Page.

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