CXD2470R Ver la hoja de datos (PDF) - Sony Semiconductor

Número de pieza

componentes Descripción

Fabricante

CXD2470R

Timing Generator for Frame Readout CCD Image Sensor

Sony Semiconductor 

RST loading characteristics

RST

Symbol

tw1

RST pulse width

CXD2470R

0.2VDDd

tw1

0.8VDDd

Definition

(Within the recommended operating conditions)

Min. Typ. Max. Unit

35

ns

VDI and HDI loading characteristics

VDI, HDI

MCKO

0.2VDDd

ts1

0.8VDDd

0.2VDDd

th1

MCKO load capacitance = 10pF∗1

(Within the recommended operating conditions)

Symbol

Definition

Min. Typ. Max. Unit

ts1

VDI and HDI setup time, activated by the rising edge of MCKO 20

ns

th1

VDI and HDI hold time, activated by the rising edge of MCKO

5

ns

Output timing characteristics using DSGAT

DSGAT

H1, H2, RG, XSHP, XSHD, XRS,

ADCLK, PBLK, CLPDM, OBCLP

0.2VDDd

tpDSGAT

0.2VDDd

H1 and H2 load capacitance = 180pF, RG load capacitance = 30pF,

XSHP, XSHD, XRS, PBLK, CLPDM, OBCLP and ADCLK load capacitance = 10pF

(Within the recommended operating conditions)

Symbol

Definition

Min. Typ. Max. Unit

tpDSGAT Time until the above outputs go low after the fall of DSGAT

100 ns

– 11 –

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