DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

HA-2425(2003) Ver la hoja de datos (PDF) - Intersil

Número de pieza
componentes Descripción
Fabricante
HA-2425
(Rev.:2003)
Intersil
Intersil Intersil
HA-2425 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
HA-2420, HA-2425
CONTROL
GND
-IN
HOLD
CAPACITOR
+IN
OUT
V-
V+
FIGURE 9. GUARD RING LAYOUT (BOTTOM VIEW)
Glossary of Terms
Acquisition Time
The time required following a “sample†command, for the output
to reach its final value within ±0.1% or ±0.01%. This is the
minimum sample time required to obtain a given accuracy, and
includes switch delay time, slewing time and settling time.
Aperture Time
The time required for the sample-and-hold switch to open,
independent of delays through the switch driver and input
amplifier circuitry. The switch opening time is that interval
between the conditions of 10% open and 90% open.
Effective Aperture Delay Time (EADT)
The difference between the digital delay time from the Hold
command to the opening of the S/H switch, and the
propagation time from the analog input to the switch.
EADT may be positive, negative or zero. If zero, the S/H
amplifier will output a voltage equal to VIN at the instant the
Hold command was received. For negative EADT, the output in
Hold (exclusive of pedestal and droop errors) will correspond to
a value of VIN that occurred before the Hold command.
Aperture Uncertainty
The range of variation in Effective Aperture Delay Time.
Aperture Uncertainty (also called Aperture Delay Uncertainty,
Aperture Time Jitter, etc.) sets a limit on the accuracy with
which a waveform can be reconstructed from sample data.
Drift Current
The net leakage current from the hold capacitor during the
hold mode. Drift current can be calculated from the droop
rate using the formula:
ID
(pA)
=
CH
(pF)
×
∆-----V--
∆t
(V â„ s )
7

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]