MC100LVEL38(2016) Ver la hoja de datos (PDF) - ON Semiconductor

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MC100LVEL38
(Rev.:2016)

3.3V ECL ÷2, ÷4/6 Clock Generation Chip

ON Semiconductor 

CLK

Q (÷2)

Q (÷4)

Q (÷6)

Phase_Out (÷4)

Phase_Out (÷6)

MC100LVEL38

Figure 3. Timing Diagrams

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC PECL Mode Power Supply

VEE NECL Mode Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

Iout Output Current

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

Continuous

Surge

VI ≤ VCC

VI ≥ VEE

8 to 0

V

−8 to 0

V

6 to 0

V

−6 to 0

50

mA

100

IBB VBB Sink/Source

TA

Operating Temperature Range

Tstg Storage Temperature Range

qJA Thermal Resistance (Junction-to-Ambient)

0 lfpm

500 lfpm

SOIC−20 WB

± 0.5

−40 to +85

−65 to +150

90

60

mA

°C

°C

°C/W

qJC Thermal Resistance (Junction-to-Case)

Tsol Wave Solder (Pb-Free)

Standard Board

SOIC−20 WB

< 2 to 3 sec @ 260°C

30 to 35

265

°C/W

°C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

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