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SSS1004 Ver la hoja de datos (PDF) - Silikron Semiconductor Co.,LTD.

Número de pieza
componentes Descripción
Fabricante
SSS1004
SILIKRON
Silikron Semiconductor Co.,LTD. SILIKRON
SSS1004 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Test circuits and Waveforms
EAS Test Circuit:
Gate charge test circuit:
SSS1004
Switching Time Test Circuit:
Switching Waveforms:
Notes:
Calculated continuous current based on maximum allowable junction temperature.
Repetitive rating; pulse width limited by max. junction temperature.
The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
©Silikron Semiconductor CO.,LTD.
2013.10.14
www.silikron.com
Version : 1.2
page 3 of 8

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