74VHC03TTR Ver la hoja de datos (PDF) - STMicroelectronics

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Fabricante

74VHC03TTR

QUAD 2-INPUT OPEN DRAIN NAND GATE

STMicroelectronics 

74VHC03

Table 8: Capacitive Characteristics

Test Condition

Value

Symbol

Parameter

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance

4 10

10

10 pF

COUT Output

Capacitance

5

pF

CPD Power Dissipation

Capacitance

6

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

) load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)

t(s Table 9: Dynamic Switching Characteristics

uc Test Condition

Value

rod Symbol

Parameter

VCC

P (V)

te VOLP Dynamic Low

le Voltage Quiet

5.0

o VOLV Output (note 1, 2)

s Dynamic High

b VIHD Voltage Input

5.0

O (note 1, 3)

- Dynamic Low

) VILD Voltage Input

5.0

t(s (note 1, 3)

CL = 50 pF

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

0.3 0.8

V

-0.8 -0.3

3.5

V

1.5

V

c 1) Worst case package.

u 2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.

d 3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (VILD), 0V to threshold

(VIHD), f=1MHz.

Obsolete Pro Figure 3: Test Circuit

CL = 15/50pF or equivalent (includes jig and probe capacitance)

RL = R1 = 1KΩ or equivalent

RT = ZOUT of pulse generator (typically 50Ω)

4/11

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