SMP30-100(2000) Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza

componentes Descripción

Fabricante

SMP30-100
(Rev.:2000)

TRISIL™

STMicroelectronics 

SMP30-xxx Series

TEST CIRCUIT 2 for IH parameter.

R

VBAT = - 48 V

D.U.T.

- VP

Surge generator

This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional test circuit.

TEST PROCEDURE :

n 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.

2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs.

3) The D.U.T will come back off-state within 50 ms max.

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