74LVT2952 Ver la hoja de datos (PDF) - NXP Semiconductors.

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Fabricante

74LVT2952

3.3 V Octal registered transceiver; 3-State

NXP Semiconductors. 

NXP Semiconductors

74LVT2952

3.3 V Octal registered transceiver; 3-State

tW

VI 90 %

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VCC

VI

PULSE

GENERATOR

VO

DUT

RT

VEXT

RL

CL

RL

001aae235

Fig 8.

Test data is given in Table 10.

Definitions test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = External voltage for measuring switching times.

Test circuit for switching times

Table 10.

Input

VI

2.7 V

Test data

fi

 10 MHz

tW

500 ns

tr, tf

 2.5 ns

Load

RL

500 

CL

50 pF

VEXT

tPHZ, tPZH

GND

tPLZ, tPZL

6V

tPLH, tPHL

open

74LVT2952

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 4 — 11 September 2013

© NXP B.V. 2013. All rights reserved.

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