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9014 Ver la hoja de datos (PDF) - Fairchild Semiconductor

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componentes Descripción
Fabricante
9014 Datasheet PDF : 16 Pages
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l
Termination
Active
G
S
P-body pattern
in active area
Discrete Plural Well
Conventional (Cellular)
Unified Singular Well
QFET (Stripe)
Figure 2-2. Comparison of a QFET and a Conventional MOSFET Active Cell
The most noticeable difference between a QFET and a conventional MOSFET is in the P-well
design (Figure 2-1). The conventional MOSFET is composed of a discrete P-well, cellular in
shape, working alone as an active cell. Whereas, a QFET consists of a unified P-well, striped
in shape, which is connected together at the edge of the active area, working in unison (See
Figure 2-2). Unlike the spherical P-well junction in cellular devices such as the conventional
MOSFET, the QFET has a cylindrical P-well junction allowing a higher breakdown voltage for a
given epitaxial layer. This improvement of breakdown voltage efficiency provides lower on
resistance by reducing resistivity and thickness of the epitaxial layer for a given breakdown
voltage. Furthermore, the gate charge and the switching characteristics are improved in a
QFET due to the reduction in the input capacitance by the increase in gate oxide thickness
and optimization of the gate overlap area. RDS(on), gate charge, and switching characteristics
are all important for determining the MOSFET loss in the set (Refer to Section 4-2). Hence, a
QFET is appropriate for computer microprocessor power supply applications which require
high efficiency.
The Fairchild FQP60N03L, a new 30V logic level MOSFET product, is appropriate for low volt-
age DC-DC converters. Figure 2-3 is a graph of RDS(on) as a function of the FQP60N03L's
Junction temperature (TJ) at VGS=5[V] / 10[V] and ID=30[A]. The change in RDS(on) which cor-
responds with the change in temperature is approximately 0.07[m/°C] when VGS=5[V] and
0.05[m/°C] when VGS=10[V].
30
25
20
15
10
5
0
-50
VGS=5[V]
VGS=10[V]
@ I =30[A]
D
0
50
100
150
200
TJ, Junction Temperature []
Figure 2-3. Change in RDS(on) as a function of temperature
2
Rev. B, July 2000

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