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100310

Low Skew 2:8 Differential Clock Driver

Fairchild Semiconductor 

Absolute Maximum Ratings(Note 1)

Storage Temperature (TSTG)

Maximum Junction Temperature (TJ)

Pin Potential to Ground Pin (VEE)

Input Voltage (DC)

Output Current (DC Output HIGH)

ESD (Note 2)

−65°C to +150°C

+150°C

−7.0V to +0.5V

VEE to +0.5V

−50 mA

≥2000V

Commercial Version

Recommended Operating

Conditions

Case Temperature (TC)

Commercial

0°C to +85°C

Industrial

−40°C to +85°C

Supply Voltage (VEE)

−5.7V to −4.2V

Note 1: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

DC Electrical Characteristics (Note 3)

VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C

Symbol

Parameter

Min

Typ

Max

Units

Conditions

VOH

Output HIGH Voltage

−1025

−955

−870

mV

VIN = VIH (Max)

Loading with

VOL

Output LOW Voltage

−1830

−1705

−1620

mV

or VIL (Min)

50Ω to −2.0V

VOHC

Output HIGH Voltage

−1035

mV

VIN = VIH

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VOLC

Output LOW Voltage

−1610

mV

or VIL (Max)

50Ω to −2.0V

VBB

Output Reference Voltage

−1380

−1320

−1260

mV

IVBB = −250 µA

VDIFF

Input Voltage Differential

150

mV Required for Full Output Swing

VCM

Common Mode Voltage

VCC − 2.0

VCC − 0.5

V

VIH

Input HIGH Voltage

−1165

−870

mV Guaranteed HIGH Signal for All Inputs

VIL

Input LOW Voltage

−1830

−1475

mV Guaranteed LOW Signal for All Inputs

IIL

Input LOW Current

0.50

µA

VIN = VIL (Min)

IIH

Input HIGH Current

240

µA

VIN = VIH (Max)

ICBO

Input Leakage Current

−10

µA

VIN = VEE

IEE

Power Supply Current

−100

−40

mA Inputs Open

Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

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