FM24CL64B Ver la hoja de datos (PDF) - Cypress Semiconductor
Número de pieza
componentes Descripción
Fabricante
FM24CL64B Datasheet PDF : 18 Pages
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FM24CL64B
Data Retention and Endurance
Parameter
Description
TDR
Data retention
NVC
Endurance
Test condition
TA = 85 ï‚°C
TA = 75 ï‚°C
TA = 65 ï‚°C
Over operating temperature
Min
10
38
151
1014
Max
Unit
–
Years
–
–
–
Cycles
Capacitance
Parameter [5]
Description
CO
Output pin capacitance (SDA)
CI
Input pin capacitance
Test Conditions
TA = 25 ï‚°C, f = 1 MHz, VDD = VDD(typ)
Max
Unit
8
pF
6
pF
Thermal Resistance
Parameter [5]
Description
ï‘JA
Thermal resistance
(junction to ambient)
ï‘JC
Thermal resistance
(junction to case)
Test Conditions
Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA/JESD51.
8-pin SOIC
147
47
8-pin DFN Unit
28
ï‚°C/W
30
ï‚°C/W
AC Test Loads and Waveforms
Figure 13. AC Test Loads and Waveforms
3.6 V
OUTPUT
1.1 kï—
100 pF
AC Test Conditions
Input pulse levels .................................10% and 90% of VDD
Input rise and fall times .................................................10 ns
Input and output timing reference levels ................0.5 × VDD
Output load capacitance ............................................ 100 pF
Note
5. This parameter is periodically sampled and not 100% tested.
Document Number: 001-84458 Rev. *I
Page 10 of 18
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