FM24CL64B
Data Retention and Endurance
Parameter
Description
TDR
Data retention
NVC
Endurance
Test condition
TA = 85 ï‚°C
TA = 75 ï‚°C
TA = 65 ï‚°C
Over operating temperature
Min
10
38
151
1014
Max
Unit
–
Years
–
–
–
Cycles
Capacitance
Parameter [4]
Description
CO
Output pin capacitance (SDA)
CI
Input pin capacitance
Test Conditions
TA = 25 ï‚°C, f = 1 MHz, VDD = VDD(typ)
Max
Unit
8
pF
6
pF
Thermal Resistance
Parameter [4]
ï‘JA
ï‘JC
Description
Thermal resistance
(junction to ambient)
Thermal resistance
(junction to case)
Test Conditions
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
8-pin SOIC
147
47
8-pin TDFN Unit
28
ï‚°C/W
30
ï‚°C/W
Note
4. This parameter is periodically sampled and not 100% tested.
Document Number: 001-84458 Rev. *D
Page 10 of 19