AD8397 Ver la hoja de datos (PDF) - Analog Devices

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Fabricante

AD8397

Rail-to-Rail, High Output Current Amplifier

Analog Devices 

ABSOLUTE MAXIMUM RATINGS

Table 5.

Parameter

Supply Voltage

Power Dissipation1

Storage Temperature

Operating Temperature Range

Lead Temperature Range

(Soldering 10 sec)

Junction Temperature

Rating

26.4 V

See Figure 4

−65°C to +125°C

−40°C to +85°C

300°C

150°C

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational sec-

tion of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

1 Thermal resistance for standard JEDEC 4-layer board:

8-lead SOIC: θJA = 157.6°C/W

8-Lead SOIC EPAD: θJA = 47.2°C/W

AD8397

MAXIMUM POWER DISSIPATION

The maximum power that can be dissipated safely by

the AD8397 is limited by the associated rise in junction

temperature. The maximum safe junction temperature for

plastic encapsulated devices is determined by the glass

transition temperature of the plastic, approximately 150°C.

Temporarily exceeding this limit may cause a shift in

parametric performance due to a change in the stresses

exerted on the die by the package.

4.5

TJ = 150°C

4.0

3.5

8-LEAD SOIC EPAD

3.0

2.5

2.0

1.5

8-LEAD SOIC

1.0

0.5

0

–40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90

AMBIENT TEMPERATURE (°C)

Figure 4. Maximum Power Dissipation vs. Temperature

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate

on the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy elec-

trostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation

or loss of functionality.

Rev. 0 | Page 7 of 16

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