N25Q128A13T12A0E Ver la hoja de datos (PDF) - Numonyx -> Micron

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Fabricante

N25Q128A13T12A0E

128-Mbit 3 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, serial flash memory with 108 MHz SPI bus interface

Numonyx -> Micron 

N25Q128 - 3 V

16 Ordering information

Ordering information

Note:

For further information on line items not listed here or on any aspect of this device, please

contact your nearest Numonyx Sales Office.

Table 37. Ordering information scheme

Example:

N25Q128 A 1 3 B F8 4 0 E

Device type

N25Q = serial Flash memory, Quad I/O, XiP

Device density

128 = 128 Mbit

Technology

A = 65 nm

Feature set

1 = Byte addressability, Hold pin, Numonyx XiP

2 = Byte addressability, Hold pin, Basic XiP

3 = Byte addressability, Reset pin, Numonyx XiP

4 = Byte addressability, Reset pin, Basic XiP

Operating voltage

3 = VCC = 2.7 V to 3.6 V

Block Structure

B = Bottom

T = Top

E = Uniform (no boot sectors)

Package

F8 = VDFPN8 8 x 6 mm (MLP8) (RoHS compliant)

SF = SO16 (300 mils width) (RoHS compliant)

12 = TBGA24 6 x 8 mm (RoHS compliant)

Temperature and test flow

4 = Industrial temperature range, –40 to 85 °C

Device tested with standard test flow

A = Automotive temperature range, –40 to 125 °C

Device tested with high reliability certified test flow

H = Industrial temperature range, –40 to 85 °C

Device tested with high reliability certified test flow

Security features (1)

0 = No extra security

Packing options

E = Tray packing

F = Tape and reel packing

G = Tube packing

1. Additional secure options are available upon customer request.

177/180

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