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R5509-42 Ver la hoja de datos (PDF) - Hamamatsu Photonics

Número de pieza
componentes Descripción
Fabricante
R5509-42
Hamamatsu
Hamamatsu Photonics Hamamatsu
R5509-42 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
The samples 2 to 6 , 11 and 12 were measured with the measurement system shown below:
Measurement System
Most of the application data in this sheet were measured with the following system using an R5509 series PMT.
Time resolved measurement and gated measurement were performed with a pulsed YAG laser and a photon counter in place of CW
laser and lock-in amplifier.
ISTRUCTURE
Excitation light: LD-pumped Nd: (SHG) YAG laser,
λ=532 nm, maximum output=50 mW
or
Pulsed Nd: (SHG) YAG laser,
λ=532 nm, pulse energy more than 12 mJ,
repetition rate=20 Hz, pulse with=5 ns to 7 ns
Monochromator: Czerny-Turner type
Aperture ratio: F=3, Focal length: 100 mm,
Diffraction grating: grooves/mm=600,
Brazed wavelength=1 µm, Wavelength resolution: 2 nm
Detector: NIR PMT R5509-42 or R5509-72
Exclusive cooler PC176TSCE005 [Cooling Temperature: -80 °C]
Sample cell: LN2 dewar or without
Signal processing: Lock-in amplifier or photon counter
ISYSTEM CONFIGURATION
WITH CW LASER + LOCK-IN AMPLIFIER
OPTICAL
CHOPPER
MIRROR
FILTER
LASER
MIRROR
DRY NITROGEN
LN2
DEWAR LENS
FILTER
MONOCHRO-
MATOR
LENS COOLER
LIQUID NITROGEN
CONTAINER
LOCK-IN
AMP
SAMPLE
NIR-PMT
COMPUTER
TPMOC0155EA
GREFERENCE
Photocathode and Photomultiplier tubes
1. M. Niigaki, T. Hirohata, T. Suzuki, N. Oishi, S. Furuta, H. Kan and T. Hiruma, "Near Infrared Photomultiplier with Transferred Electron Photoca-
thode", Bulletin of the Research Institute of Electronics, Shizuoka Univ. 30-3, 189 (1995)
2. M. Niigaki, T. Hirohata, T. Suzuki, H. Kan and T. Hiruma, "Field-assisted photoemission from InP/InGaAsP photocathode with p/n junction",
Appl. Phys. Lett., 71, 2493 (1997)
Photoluminescence
3. S. Furuta, K. Kuroyanagi, M. Niigaki, T. Hirohata, H. Kan and T. Hiruma, "Characterization of Doped-Si and SiGe Quantum Well Using Near-In-
frared Photomultiplier Tube", Bulletin of the Research Institute of Electronics, Shizuoka Univ. 30-3, 233 (1995).
4. S. Fukatsu, H. Akiyama, Y. Shiraki and H. Sakaki, J. Cryst. Growth, "Quantitative analysis of light emission from SiGe quantum wells", 157 1
(1995)
5. S. Fukatsu, H. Akiyama, Y. Shiraki and H. Sakaki, "Radiative recombination in near-surface strained Si1-xGex/Si quantum wells", Appl. Phys.
Lett., 67, 3602 (1995)
6. S. Fukatsu, Y. Mera, M. Inoue, K. Maeda, H. Akiyama and H. Sakaki, "Time-resolved D-band luminescence in strain-relieved SiGe/Si", Appl.
Phys. Lett., 68, 1889 (1996)
7. M. Tajima, S. Ibuka, H. Aga and T. Abe, "Characterization of bond etch-back silicon-on-insulator wafers by photoluminescence under ultravio-
let excitation", Appl. Phys. Lett., 70, 231 (1997)
8. M. Tajima and S. Ibuka, "Luminescence due to electron-hole condensation in silicon-on-insulator", Jpn. J. Appl. Phys., 84, 2224 (1998)
9. Y. Mita, M. Akami and S. Murayama, "Infrared photoluminescence and optical characteristics in Ge-doped ZnSe crystals", Appl. Phys. Lett., 76,
2223 (2000)
10. Takashi Suemasu, Yoichiro Negishi, Kenichiro Takakuma and Fumio Hasegawa, "Room Temperature 1 µm Electroluminescence from a Si-
Based Light Emitting Diode with β-FeSi2 Active Region", Jpn. J. Appl. Phys., 39, L1013 (2000)
11. Shigero Ibuka and Michio Tajima, "Characteristics of Silicon-on-Insulator Wafers by Photoluminescence Decay Lifetime Measurement", Jpn. J.
Appl. Phys., 39, L1124 (2000)
Singlet oxygen
12. O. Shimizu, J. Watanabe, K. Imakubo and S. Naito, "Formation of Singlet Oxygen Photosensitized by Aromaic Amino Acids in Aqueous Solu-
tions", Chemistry Lett., 19, 203 (1997)
13. O. Shimizu, J. Watanabe and K. Imakubo, "Photon-Counting Technique Facilitates both Time-and Spectra-Resolved Measurements of Near-IR
Emission of Singlet Oxygen O2(1g) in Aqueous Solution", J. Phys. Soc. Jpn., 66, 268 (1997)

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