Philips Semiconductors
Stereo Continuous Calibration DAC
(CC-DAC)
Preliminary specification
TDA1311A
SYMBOL
PARAMETER
CONDITIONS
MIN. TYP.
Timing (see Fig.4)
tr
rise time
−
tf
fall time
−
tCY
bit clock cycle time
54
tBCKH
bit clock pulse width HIGH
15
tBCKL
bit clock pulse width LOW
15
tSU;DAT
data set-up time
12
tHD:DAT
data hold time to bit clock
2
tHD:WS
word select hold time
2
tSU;WS
word select set-up time
12
Analog outputs; pins VOL and VOR
VFS
full-scale voltage
1.8
TCFS
full-scale temperature
−
coefficient
Vos
offset voltage
(THD+N)/S total harmonic distortion plus
noise
VDD = VOL/ORmax
at 0 dB signal level; note 1
0.45
−
−
at −60 dB signal level; note 1 −
−
at −60 dB signal level;
−
A-weighted; note 1
−
at 0 dB signal level; f = 20 Hz −
to 20 kHz
−
tcs
current settling time to ±1 LSB
−
αcs
channel separation
75
|δIO|
unbalance between outputs note 1
−
|td|
time delay between outputs
−
S/N
signal-to-noise ratio at
A-weighted at code 0000H 86
bipolar zero
−
−
−
−
−
−
−
−
−
2.0
±400
0.50
−68
0.04
−30
3
−33
2
−65
0.05
0.2
80
0.2
±0.2
92
Note
1. Measured with 1 kHz sinewave generated at sampling rate of 192 kHz.
MAX.
12
12
−
−
−
−
−
−
−
2.2
−
0.55
−63
0.07
−24
6
−
−
−61
0.09
−
−
0.3
−
−
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
ppm
V
dB
%
dB
%
dB
%
dB
%
µs
dB
dB
µs
dB
1995 Dec 18
7