DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

1117B24M00000BF Ver la hoja de datos (PDF) - Vectron International

Número de pieza
componentes Descripción
Fabricante
1117B24M00000BF
Vectron
Vectron International Vectron
1117B24M00000BF Datasheet PDF : 22 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
a. Design Pedigree (choose one as the 5th character in the part number):
(E) Enhanced Element Evaluation, 100krad Class S die, Premium Q Swept Quartz
(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz
(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz
(X) Hi-Rel design w/ Cultured Quartz, Class S die
(B) Hi-Rel design w/ Swept Quartz, Class B die
(C) Hi-Rel design w/ Cultured Quartz, Class B die
(D) Hi-Rel design w/ Cultured Quartz and commercial grade components
b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14th character
c. Frequency-Temperature Slew Test
d. Radiographic Inspection
e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)
f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)
g. Internal Water-Vapor Content (RGA) samples and test performance
h. MTBF Reliability Calculations
i. Worst Case/Derating Analysis
j. Deliverable Process Identification Documentation (PID)
k. Customer Source Inspection (pre-cap / final)
5.3 Test Conditions. Unless otherwise stated herein, inspections are performed in accordance with
those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process travelers
identify the applicable methods, conditions and procedures to be used. Examples of electrical
test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 3.
5.4 Special Tests and Descriptions.
5.4.1
Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as an
indicator of higher than normal internal water vapor content. The incremental temperature
sweep from +125°C to -55°C and back to +125°C records output frequency fluctuations
emulating the mass loading of moisture deposited on the crystal blank surface. Though not
replacing a customer’s internal water-vapor content (RGA) requirement, confidence is
increased without destructively testing otherwise good devices.
5.4.2
Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in delta
measurements is performed at the crystal’s upper turning point temperature where its effects on
repeatable frequency accuracy are maximized. Dependent on the crystal specified, this
temperature is typically between +65°C and +85°C, ±0.2°C.
5.5 Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lot
of devices:
a. Completed assembly and screening lot travelers, including rework history.
b. Electrical test variables data, identified by unique serial number.
c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA data as
required by purchase order.
SIZE CODE IDENT NO.
A
00136
UNSPECIFIED TOLERANCES
N/A
DWG NO.
OS-68338
REV. SHEET
K
7

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]