IHW30N160R2
Soft Switching Series
td(off)
1000ns
td(off)
100ns
tf
100ns
tf
10ns
0A 10A 20A 30A 40A 50A 60A 70A
IC, COLLECTOR CURRENT
Figure 9. Typical switching times as a
function of collector current
(inductive load, TJ=175°C,
VCE=600V, VGE=0/15V, RG=10Ω,
Dynamic test circuit in Figure E)
10Ω 20Ω 30Ω 40Ω 50Ω 60Ω 70Ω
RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ=175°C, VCE=600V,
VGE=0/15V, IC=30A,
Dynamic test circuit in Figure E)
100ns
td(off)
6V
tf
5V
4V
3V
max.
typ.
min.
10ns
25°C 50°C 75°C 100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=30A, RG=10Ω,
Dynamic test circuit in Figure E)
2V
-50°C
0°C
50°C
100°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as a
function of junction temperature
(IC = 0.15mA)
Power Semiconductors
6
Rev. 2.1 Nov 09