6N138 Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Fabricante
6N138 Datasheet PDF : 15 Pages
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Pulse
Generator
tr = 5ns
IF
Z O = 50 V
10% D.C.
I/ f< 100ns
Noise
Shield
1
2
VF
3
IF Monitor
Rm
4
8 VCC
7 VB
+5 V
RL
Pulse
Generator
IF
tr = 5ns
Z O = 50V
10% DUTY CYCLE
I/f < 100 µS
+
1
VF1
-2
6 VO
0.1 µF
5
GND
VO
CL = 15 pF*
IF
MONITOR
Rm
-3
VF2
+4
Noise
Shield
VCC
8
RL
V01
7
V02
6
GND
5
0.1 µF
+5 V
VO
CL = 15 pF*
Test Circuit for 6N138, 6N139
IF
Test Circuit for HCPL2730 and HCPL2731
VO
5V
TPHL
1.5 V
1.5 V
VOL
TPLH
Fig. 24 Switching Time Test Circuit
IF
A
B
VFF
Noise
Shield
1
2
VF
3
4
8 VCC
+5 V
7 VB
RL
6 VO
VO
0.1 µF
GND
5
-
+
V-CM
Pulse Gen
IF
A
B
VFF
Test Circuit for 6N138 and 6N139
VCM 10 V
10%
0V
tr
90% 90%
+1
VF1
-2
Noise
Shield
-3
VF2
+
4
VCC
8
RL
V01
7
V02
6
GND
5
VCM
+
-
Pulse Gen
Test Circuit for HCPL2730 and HCPL2731
10%
tf
+5 V
VO
0.1 µF
VO
5V
Switch at A : IF = 0 mA
VO
VOL
Switch at B : IF = 1.6 mA
Fig. 25 Common Mode Immunity Test Circuit
©2005 Fairchild Semiconductor Corporation
6N138, 5N139, NCPL2730, HCPL2731 Rev. 1.0.3
11
www.fairchildsemi.com
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