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74ABT623DB Ver la hoja de datos (PDF) - NXP Semiconductors.

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74ABT623DB Datasheet PDF : 15 Pages
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NXP Semiconductors
74ABT623
Octal transceiver with dual enable; non-inverting; 3-state
9. Static characteristics
Table 6.
Symbol
VIK
VOH
VOL
II
IOFF
IO(pu/pd)
IOZ
ILO
IO
ICC
ICC
CI
CI/O
Static characteristics
Parameter
Conditions
input clamping voltage VCC = 4.5 V; IIK = 18 mA
HIGH-level output
voltage
VI = VIL or VIH
VCC = 4.5 V; IOH = 3 mA
VCC = 5.0 V; IOH = 3 mA
VCC = 4.5 V; IOH = 32 mA
LOW-level output
voltage
VCC = 4.5 V; IOL = 64 mA;
VI = VIL or VIH
input leakage current VCC = 5.5 V; VI = GND or 5.5 V
OEAB, OEBA
An, Bn
power-off leakage
current
VCC = 0.0 V; VI or VO 4.5 V
power-up/power-down VCC = 2.0 V; VO = 0.5 V;
output current
VI = GND or VCC; OEAB = GND;
OEBA = VCC
OFF-state output
current
VCC = 5.5 V; VI = VIL or VIH
VO = 2.7 V
VO = 0.5 V
output leakage current HIGH-state; VO = 5.5 V;
VCC = 5.5 V; VI = GND or VCC
output current
VCC = 5.5 V; VO = 2.5 V
supply current
VCC = 5.5 V; VI = GND or VCC
outputs HIGH-state
outputs LOW-state
outputs disabled
additional supply
current
per input pin; VCC = 5.5 V;
one input pin at 3.4 V, other inputs
at VCC or GND
outputs enabled
outputs disabled
one enable input at 3.4 V and other
inputs at VCC or GND; outputs
disabled
input capacitance
input/output
capacitance
VI = 0 V or VCC
outputs disabled; VO = 0 V or VCC
25 °C
40 °C to +85 °C Unit
Min Typ Max Min Max
- 0.9 1.2
-
1.2 V
2.5 2.9 -
2.5
3.0 3.4 -
3.0
2.0 2.4 -
2.0
- 0.42 0.55
-
-V
-V
-V
0.55 V
- ±0.01 ±1.0
-
- ±5.0 ±100 -
- ±5.0 ±100 -
[1] - ±5.0 ±50
-
±1.0 µA
±100 µA
±100 µA
±50 µA
- 5.0 50
-
- 5.0 50
-
- 5.0 50
-
[2] 180 100 50 180
50 µA
50 µA
50 µA
50 mA
- 50 250
-
- 24 30
-
- 50 250
-
[3]
250 µA
30 mA
250 µA
- 0.5 1.5
-
- 50 250
-
- 0.5 1.5
-
1.5 mA
250 mA
1.5 mA
-
4
-
-
-
7
-
-
- pF
- pF
[1] This parameter is valid for any VCC between 0 V and 2.1 V, with a transition time of up to 10 ms. From VCC = 2.1 V to VCC = 5 V ± 10 %,
a transition time of up to 100 ms is permitted.
[2] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[3] This is the increase in supply current for each input at 3.4 V.
74ABT623_3
Product data sheet
Rev. 03 — 22 October 2009
© NXP B.V. 2009. All rights reserved.
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