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VNQ5050KTR-E Ver la hoja de datos (PDF) - STMicroelectronics

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VNQ5050KTR-E Datasheet PDF : 31 Pages
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VNQ5050K-E
Table 10. Open-load detection (continued)
Symbol
Parameter
Test conditions
Delay between input
tPOL
falling edge and status
rising edge in open-
IOUT = 0A (See Figure 4.)
load condition
Open-load off-state
VOL voltage detection
threshold
VIN = 0V, 8V<VCC<16V
(See Figure 23.)
Output short circuit to
tDSTKON Vcc detection delay at (See Figure 4.)
turn-off
Table 11. Logic input
Symbol
Parameter
Test conditions
VIL
IIL
VIH
IIH
VI(hyst)
Input low level
Low level input current VIN = 0.9V
Input high level
High level input current VIN = 2.1V
Input hysteresis
voltage
VICL Input clamp voltage
VSDL
STAT_DIS low level
voltage
IIN = 1mA
IIN = -1mA
ISDL
Low level STAT_DIS
current
VSD=0.9V
VSDH
STAT_DIS high level
voltage
ISDH
High level STAT_DIS
current
VSD=2.1V
VSD(hyst)
STAT_DIS hysteresis
voltage
VSDCL
STAT_DIS clamp
voltage
ISD=1mA
ISD=-1mA
Electrical specifications
Min. Typ. Max. Unit
200 500 1000 μs
2
4
V
180
tPOL μs
Min. Typ. Max. Unit
0.9 V
1
μA
2.1
V
10 μA
0.25
V
5.5
7
V
-0.7
V
0.9 V
1
μA
2.1
V
10 μA
0.25
V
5.5
7
V
-0.7
V
Doc ID 10864 Rev 7
11/31

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