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VNQ5050KTR-E Ver la hoja de datos (PDF) - STMicroelectronics

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VNQ5050KTR-E Datasheet PDF : 31 Pages
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Electrical specifications
VNQ5050K-E
Note:
Table 8.
Symbol
Status pin (VSD=0)
Parameter
Test conditions
VSTAT
ILSTAT
CSTAT
VSCL
Status low output
voltage
ISTAT= 1.6 mA, VSD=0V
Status leakage current
Normal operation or VSD=5V,
VSTAT= 5V
Status pin input
capacitance
Normal operation or VSD=5V,
VSTAT= 5V
Status clamp voltage ISTAT= 1mA
ISTAT= - 1mA
Min. Typ. Max. Unit
0.5 V
10 μA
100 pF
5.5
7
V
-0.7
V
Table 9. Protections
Symbol
Parameter
Test conditions
IlimH
IlimL
TTSD
DC short circuit
current
VCC=13V
5V<VCC<36V
Short circuit current VCC=13V
during thermal cycling TR<Tj<TTSD
Shutdown
temperature
TR Reset temperature
TRS
Thermal reset of
STATUS
THYST
tSDL
Thermal hysteresis
(TTSD-TR)
Status delay in
overload conditions
Tj>TTSD (See Figure 4)
VDEMAG
Turn-off output voltage
clamp
IOUT=2A; VIN=0; L=6mH
VON
Output voltage drop
limitation
IOUT=0.1A (see Figure 5)
Tj= -40°C...+150°C
Min.
13.5
Typ. Max. Unit
19 26.5 A
26.5 A
7
A
150 175 200 °C
TRS + 1 TRS + 5
°C
135
°C
7
°C
20 μs
VCC-41 VCC-46 VCC-52 V
25
mV
To ensure long term reliability under heavy overload or short circuit conditions, protection
and related diagnostic signals must be used together with a proper software strategy. If the
device is subjected to abnormal conditions, this software must limit the duration and number
of activation cycles
Table 10. Open-load detection
Symbol
Parameter
Test conditions
IOL
Open-load on-state
detection threshold
tDOL(on)
Open-load on-state
detection delay
VIN = 5V, 8V<Vcc<18V
(See Figure 22.)
IOUT = 0A, VCC=13V
(See Figure 4.)
Min. Typ. Max. Unit
10
70 mA
200 μs
10/31
Doc ID 10864 Rev 7

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