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VNQ5E160AKTR-E(2009) Ver la hoja de datos (PDF) - STMicroelectronics

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VNQ5E160AKTR-E Datasheet PDF : 37 Pages
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Electrical specifications
VNQ5E160AK-E
Table 7. Logic Inputs
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
VIL
Input low level voltage
IIL
Low level input current
VIN= 0.9V
VIH
Input high level voltage
IIH
High level input current
VIN= 2.1V
VI(hyst) Input hysteresis voltage
VICL Input clamp voltage
IIN= 1mA
IIN= -1mA
VCSDL CS_DIS low level voltage
ICSDL Low level CS_DIS current
VCSD= 0.9V
VCSDH CS_DIS high level voltage
ICSDH High level CS_DIS current
VCSD= 2.1V
VCSD(hyst) CS_DIS hysteresis voltage
VCSCL CS_DIS clamp voltage
ICSD= 1mA
ICSD= -1mA
Table 8. Protections and diagnostics (1)
Symbol
Parameter
Test conditions
0.9
V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
0.9
V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
Min. Typ. Max. Unit
IlimH DC short circuit current
VCC= 13V
5V<VCC<28V
IlimL
Short circuit current
during thermal cycling
VCC= 13V; TR<Tj<TTSD
7
10
14
A
14
A
2.5
A
TTSD
TR
TRS
Shutdown temperature
Reset temperature
Thermal reset of
STATUS
150 175 200 °C
TRS + 1 TRS + 5
°C
135
°C
THYST
Thermal hysteresis
(TTSD-TR)
7
°C
VDEMAG
Turn-off output voltage
clamp
IOUT= 1A; VIN= 0; L= 20mH VCC-41 VCC-46 VCC-52
V
Output voltage drop
VON limitation
IOUT= 0.03A;
Tj= -40°C...150°C
(see Figure 8.)
25
mV
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
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