DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

CY7B923-SC Ver la hoja de datos (PDF) - Cypress Semiconductor

Número de pieza
componentes Descripción
Fabricante
CY7B923-SC
Cypress
Cypress Semiconductor Cypress
CY7B923-SC Datasheet PDF : 33 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
BIST
LOOP
Tx
START
CY7B923
DON'T CARE
DON'T CARE
WITHIN SPEC.
DON'T CARE
DON'T CARE
8
LOW
HIGH
Tx
STOP
FOTO
MODE
CKW
RP
SC/D
D0–7
SVS
ENA
ENN
BISTEN
CY7B923
CY7B933
OUTA
OUTB
OUTC
ERROR
TEST
START
BIST
LOOP
Rx
BEGIN
TEST
WITHIN SPEC.
DON'T CARE
LOW
CY7B933
REFCLK
MODE
RF
TEST
END
CKR
SC/D
8
Q0–7
RVS
RDY
BISTEN
SO
DON'T CARE
INA
INB
LOW
A/B
Figure 6. BIST Illustration
BIST Mode
BIST mode functions as follows:
1. Set BISTEN LOW to begin test pattern generation. Trans-
mitter begins sending bit rate ...1010...
2. Set either ENA or ENN LOW to begin pattern sequence
generation (use of the Enable pin not being used for normal
FIFO or system interface can minimize logic delays
between the controller and transmitter).
3. Allow the Transmitter to run through several BIST loops or
until the Receiver test is complete. RP will pulse LOW once
per BIST loop, and can be used by an external counter to
monitor the number of test pattern loops.
4. When testing is completed, set BISTEN HIGH and ENA and
ENN HIGH and resume normal function.
Note: It may be advisable to send violation characters to test
the RVS output in the Receiver. This can be done by explicitly
sending a violation with the SVS input, or allowing the trans-
mitter BIST loop to run while the Receiver runs in normal
mode. The BIST loop includes deliberate violation symbols
and will adequately test the RVS function.
Document #: 38-02017 Rev. *E
Page 11 of 33

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]