N25S830HAS22IT(2014) Ver la hoja de datos (PDF) - ON Semiconductor
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N25S830HAS22IT Datasheet PDF : 12 Pages
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Table 6. TIMING TEST CONDITIONS
Item
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
Table 7. TIMING
Item
Clock Frequency
Clock Rise Time
Clock Fall Time
Clock High Time
Clock Low Time
Clock Delay Time
CS Setup Time
CS Hold Time
CS Disable Time
SCK to CS
Data Setup Time
Data Hold Time
Output Valid From Clock Low
Output Hold Time
Output Disable Time
HOLD Setup Time
HOLD Hold Time
HOLD Low to Output High−Z
HOLD High to Output Valid
N25S830HA
Symbol
fCLK
tR
tF
tHI
tLO
tCLD
tCSS
tCSH
tCSD
tSCS
tSU
tHD
tV
tHO
tDIS
tHS
tHH
tHZ
tHV
0.1 VCC to 0.9 VCC
5 ns
0.5 VCC
CL = 100 pF
−40 to +85°C
Min
Max
20
2
2
25
25
25
25
50
25
5
10
10
25
0
20
10
10
10
50
Units
MHz
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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