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HI-200/883 Ver la hoja de datos (PDF) - Intersil

Número de pieza
componentes Descripción
Fabricante
HI-200/883
Intersil
Intersil Intersil
HI-200/883 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
HI-200/883
TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Tested at: +VSUPPLY = +15V, VSUPPLY = 15V, VREF = OPEN, GND = 0V, Unless Otherwise Specified.
D.C. PARAMETERS SYMBOL
CONDITIONS
GROUP A TEMPERATURE
SUBGROUPS
(oC)
MIN
Supply Current
-ICC All Channels VA = 0V
1
25
-2.0
2, 3
-55 to 125
-2.0
All Channels VA = 3V
1
25
-2.0
2, 3
-55 to 125
-2.0
MAX
-
-
-
-
UNITS
µA
µA
µA
µA
TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Tested at: +VSUPPLY = +15V, VSUPPLY = 15V, VREF = OPEN, GND = 0V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUB-
TEMPERATURE
GROUPS
(oC)
MIN
Turn “ON” Time
tON
CL = 35pF,
RL = 1k
9
25
-
10, 11
55 to 125
-
Turn “OFF” Time
tOFF
CL = 33pF,
RL = 1k
9
25
-
10, 11
55 to 125
-
MAX
500
800
500
650
UNITS
ns
ns
ns
ns
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)
Device Tested at: +VSUPPLY = +15V, VSUPPLY = 15V, VREF = OPEN, GND = 0V
PARAMETERS
SYMBOL
CONDITIONS
NOTE
TEMPERATURE
(oC)
MIN
MAX UNITS
Address Capacitance
CA
f = 1MHz, VAL = 0V
1
Switches Input
Capacitance
CS (OFF) f = 1MHz, VAH = 5V,
1
Measured Source to GND
25
-
20
pF
25
-
20
pF
Switch Output Capacitance CD (OFF) f = 1MHz, VAH = 5V,
1
Measured Output to Ground
25
-
20
pF
CD (ON) f = 1MHz, VAL = 0V,
1
Measured Output to Ground
25
-
30
pF
Drain to Source
Capacitance
CDS
f = 1MHz, VAH = 5V
1
25
-
2.0
pF
Off Isolation
VISO
f = 200kHz, VA = 2.4, RL = 1K,
1
VGEN = 1VP-P, CL = 10pF
25
55
-
dB
Cross Talk
VCT
f = 200kHz, VA = 2.\4, RL = 1K,
1
VGEN = 1VP-P, CL = 10pF
25
60
-
dB
Charge Transfer Error
VCTE
f = 200kHz, VA = 0 to 4V,
1
CL = 0.01µF
25
-10
10
mV
NOTE:
1. Parameters listed in Table 2 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (Tables 1 and 2)
Interim Electrical Parameters (Pre Burn-in)
1
Final Electrical Test Parameters
1 (Note 2), 2, 3, 9, 10, 11
Group A Test Requirements
1, 2, 3, 9, 10, 11
Groups C & D Endpoints
1
NOTE:
2. PDA applies to Subgroup 1 only.
3

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